Yongshuai GeResearchers develop perovskite X-ray detectors: A promising advance for lower-dose medical imaging
Researchers from the Shanghai Institute of Optics and Fine Mechanics (SIOM) at the Chinese Academy of Sciences, collaborating with colleagues from Central China Normal University, have developed a novel perovskite-based X-ray detector integrated with a complementary metal-oxide-semiconductor (CMOS) pixel array.
